ion spectroscopy;
photoionization;
doubly charged ions;
fragmentation dynamics;
D O I:
10.1016/S1387-3806(99)00084-6
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
O56 [分子物理学、原子物理学];
学科分类号:
070203 ;
070304 ;
081704 ;
1406 ;
摘要:
Photoelectron-photoion coincidence measurements have been performed on SO2 at energies up to 40.8 eV, and analysed using a new method of data analysis to determine the energy balance in the main dissociation pathways. In SO+ + O+ formation, ground state products are formed near threshold, but excited products are formed with higher energy transfer. (C) 1999 Elsevier Science B.V.