Development and characterization of high-efficiency Ga0.5In0.5P/GaAs/Ge dual- and triple-junction solar cells

被引:76
作者
Karam, NH [1 ]
King, RR
Cavicchi, BT
Krut, DD
Ermer, JH
Haddad, M
Cai, L
Joslin, DE
Takahashi, M
Eldredge, JW
Nishikawa, WT
Lillington, DR
Keyes, BM
Ahrenkiel, RK
机构
[1] Spectrolab Inc, Sylmar, CA 91342 USA
[2] Natl Renewable Energy Lab, Golden, CO 80401 USA
基金
美国国家航空航天局;
关键词
Ga0.5In0.5P; high-efficiency; multijunction; photovoltaics; solar cells;
D O I
10.1109/16.792006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes recent progress in the characterization, analysis, and development of high-efficiency, radiation-resistant Ga0.5In0.5P/GaAs/Ge dual-junction (DJ) and triple-junction (TJ) solar cells, DJ cells have rapidly transitioned from the laboratory to full-scale (325 kW/year) production at Spectro-lab. Performance data for over 470 000 large-area (26.93 cm(2)), thin (140 mu m) DJ solar cells groan on low-cost, high-strength Ge substrates are shown, Advances in next-generation triple-junction Ga0.5In0.5P/GaAs/Ge cells with an active Ge component cell are discussed, giving efficiencies up to 26.7% (21.65-cm(2) area), AM0, at 28 degrees C, Final-to-initial power ratios P/P-0 of 0.83 were measured for these n-on-p DJ and TJ cells after ir radiation with 10(15) 1-MeV electrons/cm(2). Time-resolved photoluminescence measurements are applied to double heterostructures grown with semiconductor lavers and interfaces relevant to these multijunction solar cells, to characterize surface and bulk recombination and guide further device improvements, Dual- and triple-junction Ga0.5In0.5P/GaAs/Ge cells are compared to competing space photovoltaic technologies, and found to offer 60-75% more end-of-life power than high-efficiency Si cells at a nominal array temperature of 60 degrees C.
引用
收藏
页码:2116 / 2125
页数:10
相关论文
共 13 条
  • [1] AHRENKIEL RK, 1993, SEMICONDUCTORS SEMIM, V39
  • [2] [Anonymous], 1998, 2nd World Conference on Photovoltaic Solar Energy Conversion, Vienna, Austria, 6-10 July
  • [3] BERNTESS KA, 1991, P 22 IEEE PVSC, P1582
  • [4] CATHODOLUMINESCENCE MEASUREMENTS OF MINORITY-CARRIER LIFETIME IN SEMICONDUCTORS
    BOULOU, M
    BOIS, D
    [J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (11) : 4713 - 4721
  • [5] CAVICCHI BT, 1998, P 2 WORLD C PHOT SOL, P3515
  • [6] FRIEDMAN DJ, 1994, P 1 WORLD C PVEC, P1829
  • [7] KARAM NH, 1998, P 2 WORLD C PHOT SOL, P3534
  • [8] KARAM NH, 1999, P 11 INT PV SCI ENG
  • [9] KRUT DD, 1998, P 2 WORLD C PVEC, P3671
  • [10] DETERMINATION OF THE GALNP ALGALNP BAND OFFSET
    LIEDENBAUM, CTHF
    VALSTER, A
    SEVERENS, ALGJ
    THOOFT, GW
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (25) : 2698 - 2700