Propagation length of long-range surface optic waves in islandized silver films

被引：6

作者：

Takabayashi, M

Haraguchi, M

Fukui, M

机构：

[1] Department of Optical Science and Technology, The University of Tokushima, Tokushima

来源：

JOURNAL OF MODERN OPTICS | 1997年 / 44卷 / 01期

关键词：

D O I：

10.1080/09500349708232903

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The propagation length L of long-range surface optic waves in islandized Ag films sandwiched by identical dielectrics at a wavelength of 632.8 nm has been measured. Two measurement methods were adopted: (i) an attenuated total reflection (ATR) method, and (ii) a method involving measuring the spatial distribution of the reflected intensity in an ATR geometry. By using both methods, a value for L of similar to 480 mu m was obtained fora mass thickness of 2.7 nm.

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页码：119 / 125

页数：7

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