In situ scanning tunneling microscope investigation of passivation and stainless steels and iron

被引：14

作者：

Schreyer, A

Eng, L

Bohni, H

机构：

[1] SWISS FED INST TECHNOL,INST QUANTUM ELECTR,CH-8093 ZURICH,SWITZERLAND

[2] SWISS FED INST TECHNOL,INST MAT CHEM & CORROS,CH-8093 ZURICH,SWITZERLAND

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 02期

关键词：

D O I：

10.1116/1.588421

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In situ scanning probe microscopy (SPM) is used to characterize passivation of steel alloys [DIN 1.4301 and 1.4529 (DIN is the German characterization number, comparable to AISI numbers)] as well as pure iron in 0.01 M sulfuric acid and boron buffer solution (pH 8.4), respectively It is shown, that using d(ln i)/ds spectroscopy semiconducting properties of the growing passive layer can be investigated. (C) 1996 American Vacuum Society.

引用

收藏

页码：1162 / 1166

页数：5

相关论文

共 24 条

[1] USE OF O-18 SIMS AND ELECTROCHEMICAL TECHNIQUES TO STUDY THE REDUCTION AND BREAKDOWN OF PASSIVE OXIDE-FILMS ON IRON [J].

BARDWELL, JA ;

MACDOUGALL, B ;

GRAHAM, MJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (02) :413-418

[2]

BAROUX B, 1983, PASSIVITY METALS SEM, P731

[3] ELECTROLYTIC SCANNING TUNNELING MICROSCOPY AND POINT CONTACT STUDIES AT ELECTROCHEMICALLY POLISHED AU(111) SUBSTRATES WITH AND WITHOUT PB ADSORBATES [J].

BINGGELI, M ;

CARNAL, D ;

NYFFENEGGER, R ;

SIEGENTHALER, H ;

CHRISTOPH, R ;

ROHRER, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (04) :1985-1992

[4]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[5]

BORCH G, 1983, PROT MET+, P540

[6] THE PASSIVE FILM ON IRON - AN INVESTIGATION BY ELECTRON BACKSCATTERING MOSSBAUER-SPECTROSCOPY [J].

BRETT, ME ;

PARKIN, KM ;

GRAHAM, MJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (10) :2031-2035

[7] ON THE ROLE OF CR IN THE PASSIVITY OF STAINLESS-STEEL [J].

BROOKS, AR ;

CLAYTON, CR ;

DOSS, K ;

LU, YC .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (12) :2459-2464

[8] AN ELLIPSOMETRIC SPECTROSCOPIC STUDY OF THE PASSIVE FILM ON IRON-POTENTIAL AND CHLORIDE-ION DEPENDENCE [J].

CHIN, YT ;

CAHAN, BD .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (09) :2432-2442

[9]

ELSENER B, 1993, UNPUB P 12 INT CORR, P2120

[10] ELECTRON DIFFRACTION STUDIES OF ACTIVE PASSIVE AND TRANSPASSIVE OXIDE FILMS FORMED ON IRON [J].

FOLEY, CL ;

KRUGER, J ;

BECHTOLDT, CJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1967, 114 (10) :994-+