3D determination of grain shape in a FeAl-based nanocomposite by 3D FIB tomography

被引:129
作者
Inkson, BJ
Mulvihill, M
Möbus, G
机构
[1] Univ Oxford, Dept Mat Sci, Oxford OX1 3PH, England
[2] Xinet Inc, Devens, MA 01432 USA
基金
英国工程与自然科学研究理事会;
关键词
3D; focused ion beam microscopy; grain shape; intermetallics; tomography;
D O I
10.1016/S1359-6462(01)01090-9
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The 3D shapes of individual grains in an extruded FeAl nanocomposite have been deter-mined by a new method of 3D focused ion beam (FIB) tomographic analysis. Sequential 2D sectioning and imaging of grains using a FIB, and computer reconstruction can locate the grain boundaries with better than 100 nm precision. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:753 / 758
页数:6
相关论文
共 12 条
  • [1] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
    CEREZO, A
    GODFREY, TJ
    SMITH, GDW
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (06) : 862 - 866
  • [2] Reconstruction of three-dimensional chemistry and geometry using focused ion beam microscopy
    Dunn, DN
    Hull, R
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (21) : 3414 - 3416
  • [3] TOPOCHEMICAL CHARACTERIZATION OF MATERIALS USING 3D-SIMS
    HUTTER, H
    WILHARTITZ, P
    GRASSERBAUER, M
    [J]. FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1993, 346 (1-3): : 66 - 68
  • [4] Inkson BJ, 1997, MAT RES S C, V460, P767
  • [5] Friction welding of FeAl40 grade 3 ODS alloy
    Inkson, BJ
    Threadgill, PL
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1998, 258 (1-2): : 313 - 318
  • [6] Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy
    Inkson, BJ
    Steer, T
    Möbus, G
    Wagner, T
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 2001, 201 : 256 - 269
  • [7] INKSON BJ, IN PRESS MRS P, V649
  • [8] ION CHANNELING EFFECTS IN SCANNING ION MICROSCOPY WITH A 60 KEV GA+ PROBE
    LEVISETTI, R
    FOX, TR
    LAM, K
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 205 (1-2): : 299 - 309
  • [9] MOBUS G, 2001, IN PRESS MICR MICR P
  • [10] APPLICATIONS OF FOCUSED ION-BEAM TECHNIQUE TO FAILURE ANALYSIS OF VERY LARGE-SCALE INTEGRATIONS - A REVIEW
    NIKAWA, K
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (05): : 2566 - 2577