Thermal conductivity of thin metallic films measured by photothermal profile analysis

Thermal conductivity of nickel and gold films on quartz (thickness 0.4-8 mu m) was measured by a modulated thermoreflectance technique recording the surface temperature profile. Model calculations predict an optimum frequency for measuring thermal transport within the film. Measurements on films with various thicknesses reveal a thermal conductivity close to the bulk value for nickel while gold films exhibit a reduced conductivity with decreasing film thickness. (C) 1997 American Institute of Physics.