Friction force microscopy

被引：43

作者：

Bennewitz, Roland ^{[1
,2
]}

机构：

[1] McGill Univ, Dept Phys, Montreal, PQ, Canada

[2] McGill Univ, McGill Inst Adv Mat, Montreal, PQ, Canada

来源：

MATERIALS TODAY | 2005年 / 8卷 / 05期

关键词：

D O I：

10.1016/S1369-7021(05)00845-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Friction force microscopy (FFM) can detect lateral force variations on the atomic scale when sliding a sharp tip over a flat surface. The sliding often takes the form of a stick-slip movement with the same periodicity as the atomic lattice. Here, I discuss how the occurrence of stick-slip instabilities is related to the onset of dissipation. The velocity and load dependence of atomic friction on various materials are discussed in the light of simple classical laws of friction.

引用

页码：42 / 48

页数：7

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