Electron backscatter diffraction and cracking

被引:107
作者
Gourgues, AF [1 ]
机构
[1] Ecole Natl Super Mines, CNRS, UMR 7633, Ctr Mat P M Fourt, F-91003 Evry, France
关键词
D O I
10.1179/026708301125000320
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electron backscatter diffraction (EBSD) is now a well developed technique that allows for determination of `microtexture', i.e. texture at the scale of the grain size. The effect of the local crystallographic properties on microscopic and macroscopic cracking resistance was studied in a large number of materials. Electron backscatter diffraction and EBSD related techniques provide a lot of data concerning intergranular, brittle transgranular, and fatigue cracking. In particular, they help with understanding the role of the grain boundary structure, the grain orientation and the misorientation between grains respectively. Electron backscatter diffraction characterisation of interfaces has already led to improvements of material performance in practical industrial applications, a typical example being given by grain boundary engineering. Information about the local crystallography together with a high spatial resolution encourages the application of the technique to cracking modes of other materials such as ceramics. Moreover, EBSD data can be of great relevance in micromechanical modelling of properties of polycrystalline materials.
引用
收藏
页码:119 / 133
页数:15
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