A robust procedure for absolute phase measurement

被引：83

作者：

Nadeborn, W

Andra, P

Osten, W

机构：

[1] BIAS—Bremen Institute of Applied Beam Technology, Bremen, D-28359

来源：

OPTICS AND LASERS IN ENGINEERING | 1996年 / 24卷 / 2-3期

关键词：

D O I：

10.1016/0143-8166(95)00017-8

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A robust procedure for the measurement of absolute phase values with high accuracy is presented. This procedure is based on the derivation of a precision adapted sequence of grid orientations and the stepwise reconstruction of the continuous phase field without phase unwrapping. The determination of the angle sequence is oriented on the phase measuring accuracy and the known limits of the absolute phase. Similar results can be derived for the variation of the synthetic wavelength using contouring techniques where the object is illuminated with different wavelengths.

引用

页码：245 / 260

页数：16

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