High-resolution image simulation of overlap structures in TiAl alloy

被引:16
作者
Chen, C. L. [1 ,2 ]
Lu, W. [1 ,2 ]
Cui, Y. Y.
He, L. L.
Ye, H. Q.
机构
[1] Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
关键词
Intermetallics; Scanning and transmission electron microscopy; Crystal structural and symmetry; GAMMA-TITANIUM ALUMINIDES; TRANSMISSION ELECTRON-MICROSCOPY; DEFORMED TI-45AL-10NB ALLOY; MECHANICAL-PROPERTIES; LAMELLAR MICROSTRUCTURE; INTERFACIAL BOUNDARIES; INTERMETALLIC ALLOYS; STACKING-FAULTS; CREEP-BEHAVIOR; PST CRYSTALS;
D O I
10.1016/j.jallcom.2008.01.027
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
High-resolution electron microscopy (HREM) images of the overlap structures in TiAl have been studied by the comparisons of experimental techniques and theoretic simulations. Several misunderstandings about TiAl microstructures were corrected. First, studies revealed that the reported 9R structures in TiAl must result from the overlap of two twin-relaled gamma laths. They were not the true 9R structure. Second, the fringes (FR) between the gamma and alpha(2) phases have once been misconsidered as the stacking faults fringes which promoted the alpha(2) <-> gamma phase transformation, This work proved them lobe the fringes caused by the overlap of the alpha(2) and gamma phases. Through study of the imaging of the overlap structures, a new formation mechanism of the fringes has been proposed. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:179 / 186
页数:8
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