Realistic model tips in simulations of nc-AFM

被引:17
作者
Foster, AS
Shluger, AL
Nieminen, RM
机构
[1] Helsinki Univ Technol, Phys Lab, Helsinki 02015, Finland
[2] UCL, Dept Phys & Astron, London WC1E 6BT, England
关键词
D O I
10.1088/0957-4484/15/2/013
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study we use first principle methods to study the interaction of three different tip models with a CaF(2) (111) surface. The tip models are based on a 'realistic' approach to tip simulation and consist of a pure silicon tip, an oxygen terminated silicon tip and a water contaminated silica (SiO(2)) tip. We find that each tip demonstrates characteristic features which should be observable in experiments and hence provide signatures which would aid in the identification of tip and surface species.
引用
收藏
页码:S60 / S64
页数:5
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