Atomic resolution imaging and force versus distance measurements on KBr (001) using low temperature scanning force microscopy

被引：28

作者：

Hoffmann, R ^{[1
]}

Lantz, MA ^{[1
]}

Hug, HJ ^{[1
]}

van Schendel, PJA ^{[1
]}

Kappenberger, P ^{[1
]}

Martin, S ^{[1
]}

Baratoff, A ^{[1
]}

Güntherodt, HJ ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 3-4期

关键词：

alkali halide surfaces; low temperature scanning force microscopy interaction forces;

D O I：

10.1016/S0169-4332(01)00915-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Atomic scale dynamic scanning force microscopy images and force versus distance measurements at low temperatures on a cleaved KBr (0 0 1) single crystal are reported. Two distinct forms of atomically resolved contrast were observed. In one case, a nanotip was formed through a tip change. In this case, a strong corrugation of 0.07 nm was measured. It was possible to reverse this tip change intentionally. In the second case, the observed contrast was only 0.025 nm. The force-distance measurements are well modelled with a van der Waals force in the distance range of 0.5-15 nm. The residual forces at smaller tip-sample distances show a maximum attraction of 0.3 nN and decay within 0.2 nm. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：238 / 244

页数：7

共 15 条

[1] Parametric tip model and force-distance relation for Hamaker constant determination from atomic force microscopy [J].