Beyond single scattering off flat samples

被引：4

作者：

Barradas, NP

Fonseca, A

Franco, N

Alves, E

机构：

[1] Inst Tecnol & Nucl, P-2685953 Sacavem, Portugal

[2] Univ Lisbon, Ctr Fis Nucl, P-1649003 Lisbon, Portugal

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2005年 / 241卷 / 1-4期

关键词：

RBS; roughness; multilayers; magnetoresistive materials;

D O I：

10.1016/j.nimb.2005.07.036

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Most RBS data analysis assumes straight trajectories and one single large angle backscattering event for the analysing beam, and flat sample surface and interfaces. Multiple scattering, plural scattering, and roughness are often ignored. This may lead to erroneous data analysis. In complex systems, understanding and taking into account these effects is essential. We discuss pitfalls that can occur when they are ignored, with emphasis on multilayer systems. (c) 2005 Elsevier B.V. All rights reserved.

引用

收藏

页码：316 / 320

页数：5

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