Generalized ellipsometry for biaxial absorbing materials:: determination of crystal orientation and optical constants of Sb2S3

被引：36

作者：

Schubert, M

Dollase, W

机构：

[1] Univ Leipzig, Fak Phys & Geowissensch, Inst Expt Phys 2, D-04103 Leipzig, Germany

[2] Lincoln Univ, Dept Elect Engn, Lincoln, NE 68588 USA

[3] Univ Calif Los Angeles, Dept Earth & Space Sci, Los Angeles, CA 90095 USA

[4] Univ Bayreuth, Bayer Geoinst, D-8580 Bayreuth, Germany

来源：

OPTICS LETTERS | 2002年 / 27卷 / 23期

关键词：

D O I：

10.1364/OL.27.002073

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate generalized ellipsometry for precise measurement of the principal indices of refraction, the extinction coefficients, and the orientations of the crystal a, b, and c axes of orthorhombic absorbing materials. Stibnite (Sb2S3) single crystals cut approximately parallel to (100), (010), (001), and (313) are studied at a representative wavelength of 589 nm. The (313) surface is sufficient for retrieval of all optical constants. The expected effects of surface over-layer formation are removed numerically. We propose generalized ellipsometry as a powerful tool for measurement of anisotropic optical function spectra of biaxial materials. (C) 2002 Optical Society of America.

引用

页码：2073 / 2075

页数：3

共 22 条

[1] Phase modification ky instantaneous heat treatment of Sb2S3 films and their potential for photothermal optical recording [J].