Surface photovoltage studies of InxGa1-xAs and InxGa1-xAs1-yNy quantum well structures -: art. no. 205324

被引:34
作者
Dumitras, G
Riechert, H
Porteanu, H
Koch, F
机构
[1] Infineon Technol, Corp Res Photon, D-81730 Munich, Germany
[2] Tech Univ Munich, Dept Phys, D-85747 Garching, Germany
来源
PHYSICAL REVIEW B | 2002年 / 66卷 / 20期
关键词
D O I
10.1103/PhysRevB.66.205324
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Surface photovoltage in GaAs-based type I strained quantum well structures is discussed. First, a model for the photovoltage generation in our samples is presented. Then surface photovoltage spectra of two structures, GaAs/InGaAs/GaAs and GaAs/InGaAsN/GaAs, are analyzed. The samples show four steplike main features in the spectrum. The InGaAs sample shows also excitonic peaks associated with some of the steps. To explain the spectra, a comparison with calculations and photoluminescence measurements is made. For photon energies under the barrier band gap, the photovoltage is generated due to the optical absorption in the quantum well. To account for the magnitude of the photovoltage in this case, carriers must escape out of the quantum well. We propose and discuss three such carrier excitation-escape mechanisms. We discuss the role of an optical transition involving confined and extended states in the surface photovoltage spectra. By analyzing the temperature dependence of the spectra we come to the conclusion that the transitions involving extended states play an essential role in the photovoltage generation in our quantum well (QW) samples. This allows the determination of the band alignment of QW structures. We find that by adding 1,7% N in In0.35Ga0.65As strained quantum wells, the energies of the valence band maximum and conduction band minimum are lowered by 43 and 140 meV, respectively, at room temperature.
引用
收藏
页码:1 / 8
页数:8
相关论文
共 21 条
[1]   Surface photovoltage spectroscopy of an InGaAs/GaAs/AlGaAs single quantum well laser structure [J].
Ashkenasy, N ;
Leibovitch, M ;
Shapira, Y ;
Pollak, FH ;
Burnham, GT ;
Wang, X .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (02) :1146-1149
[2]  
BachrachAshkenasy N, 1996, APPL PHYS LETT, V68, P879, DOI 10.1063/1.116217
[3]  
Bastard G., 1992, WAVE MECH APPL SEMIC
[4]   RESONANT CARRIER CAPTURE BY SEMICONDUCTOR QUANTUM-WELLS [J].
BRUM, JA ;
BASTARD, G .
PHYSICAL REVIEW B, 1986, 33 (02) :1420-1423
[5]   Surface photovoltage spectroscopy of porous silicon [J].
Burstein, L ;
Shapira, Y ;
Partee, J ;
Shinar, J ;
Lubianiker, Y ;
Balberg, I .
PHYSICAL REVIEW B, 1997, 55 (04) :R1930-R1933
[6]   GAP PHOTOVOLTAGE TRANSIENTS [J].
DAHLBERG, SC ;
CHELIKOWSKY, JR ;
ORR, WA .
PHYSICAL REVIEW B, 1977, 15 (06) :3163-3168
[7]   Electroreflectance and surface photovoltage spectroscopies of semiconductor structures using an indium-tin-oxide-coated glass electrode in soft contact mode [J].
Datta, S ;
Ghosh, S ;
Arora, BM .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (01) :177-183
[8]   Bound exciton effect and carrier escape mechanisms in temperature-dependent surface photovoltage spectroscopy of a single quantum well [J].
Datta, S ;
Arora, BM ;
Kumar, S .
PHYSICAL REVIEW B, 2000, 62 (20) :13604-13611
[9]   High power CW operation of InGaAsN lasers at 1.3μm [J].
Egorov, AY ;
Bernklau, D ;
Livshits, D ;
Ustinov, V ;
Alferov, ZI ;
Riechert, H .
ELECTRONICS LETTERS, 1999, 35 (19) :1643-1644
[10]   QUANTUM-WELL CARRIER SWEEP OUT - RELATION TO ELECTROABSORPTION AND EXCITON SATURATION [J].
FOX, AM ;
MILLER, DAB ;
LIVESCU, G ;
CUNNINGHAM, JE ;
JAN, WY .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1991, 27 (10) :2281-2295