X-ray particle image velocimetry for measuring quantitative flow information inside opaque objects

被引：85

作者：

Lee, SJ ^{[1
]}

Kim, GB ^{[1
]}

机构：

[1] Pohang Univ Sci & Technol, Dept Mech Engn, Pohang 790784, South Korea

来源：

JOURNAL OF APPLIED PHYSICS | 2003年 / 94卷 / 05期

关键词：

D O I：

10.1063/1.1599981

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An x-ray particle image velocimetry (PIV) technique was developed to measure quantitative information on flows inside opaque objects. To acquire x-ray images suitable for PIV velocity field measurements, refraction-based edge enhancement was employed using detectable tracer particles with the object and detector separated by an experimentally determined optimal distance. The x-ray PIV method was applied to a flow in an opaque Teflon tube. The resulting amassed velocity field data were in reasonable agreement with theoretical predictions. (C) 2003 American Institute of Physics.

引用

页码：3620 / 3623

页数：4

共 11 条

[1]

ADRIAN RJ, 1991, ANNU REV FLUID MECH, V23, P261, DOI 10.1146/annurev.fluid.23.1.261

[2] Diffraction enhanced x-ray imaging [J].

Chapman, D ;

Thomlinson, W ;

Johnston, RE ;

Washburn, D ;

Pisano, E ;

Gmur, N ;

Zhong, Z ;

Menk, R ;

Arfelli, F ;

Sayers, D .

PHYSICS IN MEDICINE AND BIOLOGY, 1997, 42 (11) :2015-2025

[3] Hard x-ray quantitative non-interferometric phase-contrast microscopy [J].

Gureyev, TE ;

Raven, C ;

Snigirev, A ;

Snigireva, I ;

Wilkins, SW .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1999, 32 (05) :563-567

[4] Phase-mapping of periodically domain-inverted LiNbO3 with coherent X-rays [J].

Hu, ZH ;

Thomas, PA ;

Snigirev, A ;

Snigireva, I ;

Souvorov, A ;

Smith, PGR ;

Ross, GW ;

Teat, S .

NATURE, 1998, 392 (6677) :690-693

[5] Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms [J].

Hwu, Y ;

Hsieh, HH ;

Lu, MJ ;

Tsai, WL ;

Lin, HM ;

Goh, WC ;

Lai, B ;

Je, JH ;

Kim, CK ;

Noh, DY ;

Youn, HS ;

Tromba, G ;

Margaritondo, G .

JOURNAL OF APPLIED PHYSICS, 1999, 86 (08) :4613-4618

[6] Coherence-based edge diffraction sharpening of x-ray images: A simple model [J].

Margaritondo, G ;

Tromba, G .

JOURNAL OF APPLIED PHYSICS, 1999, 85 (07) :3406-3408

[7] Quantitative phase imaging using hard x rays [J].

Nugent, KA ;

Gureyev, TE ;

Cookson, DF ;

Paganin, D ;

Barnea, Z .

PHYSICAL REVIEW LETTERS, 1996, 77 (14) :2961-2964

[8] Contrast and resolution in imaging with a microfocus x-ray source [J].

Pogany, A ;

Gao, D ;

Wilkins, SW .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (07) :2774-2782

[9] Phase-contrast microtomography with coherent high-energy synchrotron x rays [J].

Raven, C ;

Snigirev, A ;

Snigireva, I ;

Spanne, P ;

Souvorov, A ;

Kohn, V .

APPLIED PHYSICS LETTERS, 1996, 69 (13) :1826-1828

[10] On the possibilities of x-ray phase contrast microimaging by coherent high-energy synchrotron radiation [J].

Snigirev, A ;

Snigireva, I ;

Kohn, V ;

Kuznetsov, S ;

Schelokov, I .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (12) :5486-5492

← 1 2 →