Anodic stripping voltammetry: An AFM study of some problems and limitations

被引:33
作者
Hyde, ME [1 ]
Banks, CE [1 ]
Compton, RG [1 ]
机构
[1] Univ Oxford, Phys & Theoret Chem Lab, Oxford OX1 3QZ, England
关键词
anodic stripping voltammetry; atomic force microscopy; electrodeposition; nucleation;
D O I
10.1002/elan.200302863
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The use of anodic stripping voltammetry for quantitative analytical measurements using solid electrodes is addressed in the light of generic limitations arising from i) electrode heterogeneity, ii) electrode morphology, iii) inhibited electrodeposition, and iv) incomplete stripping of deposited metal in the anodic sweep. It is shown, using direct imaging of electrode surfaces via AFM and optical microscopy, that each of the preceding factors may produce significant deviations from ideal electrode behavior. The use of atomic force microscopy to fully characterize any developed ASV procedures is strongly recommended. To ensure reproducible and accurate stripping voltammetry, steps should be taken to minimize the effects discussed.
引用
收藏
页码:345 / 354
页数:10
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