Nanoscale wettability of self-assembled monolayers investigated by noncontact atomic force microscopy

被引:51
作者
Checco, A
Schollmeyer, H
Daillant, J
Guenoun, P
Boukherroub, R
机构
[1] CEA Saclay, LIONS, Serv Chim Mol, F-91191 Gif Sur Yvette, France
[2] CEA Saclay, Serv Phys Etat Condense, F-91191 Gif Sur Yvette, France
[3] Inst Rech Interdisciplinaire, Inst Elect Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France
关键词
D O I
10.1021/la051419b
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We report on a novel technique to nucleate nanometer-sized droplets on a solid substrate and to image them with minimal perturbation by noncontact atomic force microscopy (NC-AFM). The drop size can be accurately controlled, thus permitting hysteresis measurements. We have studied the nanoscale wettability of several methyl-terminated substrates prepared by the self-assembly of organic molecules. These substrates are alkyltrichlorosilanes on silica, alkylthiols on gold, alkyl chains on hydrogen-terminated silicon, and crystalline hexatriacontane chains on silica. For each of these systems, we report a deviation of the wetting contact angle from the macroscopic value, and we discuss this effect in term of mesoscale surface heterogeneity and long-range solid-liquid interactions.
引用
收藏
页码:116 / 126
页数:11
相关论文
共 64 条
[1]  
Abe K, 2000, LANGMUIR, V16, P2394, DOI 10.1021/1a990624m
[2]   How to measure energy dissipation in dynamic mode atomic force microscopy [J].
Anczykowski, B ;
Gotsmann, B ;
Fuchs, H ;
Cleveland, JP ;
Elings, VB .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :376-382
[3]   Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation [J].
Anczykowski, B ;
Cleveland, JP ;
Kruger, D ;
Elings, V ;
Fuchs, H .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S885-S889
[4]  
[Anonymous], 1992, INTERMOLECULAR SURFA
[5]   Ultra-sensitive imaging and interfacial analysis of patterned hydrophilic SAM surfaces using energy dissipation chemical force microscopy [J].
Ashby, PD ;
Lieber, CM .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2005, 127 (18) :6814-6818
[6]   FORMATION OF MONOLAYER FILMS BY THE SPONTANEOUS ASSEMBLY OF ORGANIC THIOLS FROM SOLUTION ONTO GOLD [J].
BAIN, CD ;
TROUGHTON, EB ;
TAO, YT ;
EVALL, J ;
WHITESIDES, GM ;
NUZZO, RG .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1989, 111 (01) :321-335
[7]   Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy [J].
Bar, G ;
Brandsch, R ;
Whangbo, MH .
LANGMUIR, 1998, 14 (26) :7343-7348
[8]   OPTICAL SCAN-CORRECTION SYSTEM APPLIED TO ATOMIC FORCE MICROSCOPY [J].
BARRETT, RC ;
QUATE, CF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (06) :1393-1399
[9]   Quantitative study of laterally inhomogeneous wetting films [J].
Bauer, C ;
Dietrich, S .
EUROPEAN PHYSICAL JOURNAL B, 1999, 10 (04) :767-779
[10]   Rough wetting [J].
Bico, J ;
Tordeux, C ;
Quéré, D .
EUROPHYSICS LETTERS, 2001, 55 (02) :214-220