Self-similarity and pattern selection in the roughening of binary liquid films

被引:18
作者
Hoppe, H [1 ]
Heuberger, M [1 ]
Klein, J [1 ]
机构
[1] Weizmann Inst Sci, IL-76100 Rehovot, Israel
关键词
D O I
10.1103/PhysRevLett.86.4863
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Films of spinodally decomposing binary liquid mixtures show transient wetting of both confining interfaces by one of the phases, and rupture, with characteristic wavelength lambda (c) and time T-rupture, leading to flat droplets of the nonwetting phase encapsulated by the wetting phase. Over the entire range of film thicknesses d approximate to 100-3500 nm, we find T-rupture proportional to d(1.01 +/-0.08), indicating film structures that scale self-similarly with d, and find also that lambda (c) approximate to 60d(0.97 +/-0.03), the large prefactor suggesting a rupture wavelength which minimizes the interfacial tension of the roughened film.
引用
收藏
页码:4863 / 4866
页数:4
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