Tunnel barrier height oscillations at the solid/liquid interface

被引：69

作者：

Hugelmann, M

Schindler, W

机构：

[1] Univ Karlsruhe, Inst Hochfrequenztech & Quantenelekt, D-76128 Karlsruhe, Germany

[2] Univ Karlsruhe, Ctr Funct Nanostruct, D-76128 Karlsruhe, Germany

来源：

SURFACE SCIENCE | 2003年 / 541卷 / 1-3期

关键词：

scanning tunneling microscopy; scanning tunneling spectroscopies; surface electronic phenomena (work function; surface potential; surface states; etc.); tunneling; gold; solid-liquid interfaces; metal-electrolyte interfaces;

D O I：

10.1016/S0039-6028(03)00923-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The tunneling probability at the solid/liquid interface has been probed in real space at Au(1 1 1) surfaces using high resolution in situ distance tunneling spectroscopy (DTS). The exponential decay of the tunneling current with the gap width is modulated with oscillations of a period of 0.35 nm. This period coincides with the theoretically predicted spacing of the interfacial water layers at the charged solid/liquid interface. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：L643 / L648

页数：6

共 31 条

[11] TUNNELING MECHANISMS IN ELECTROCHEMICAL STM - DISTANCE AND VOLTAGE TUNNELING SPECTROSCOPY [J].