Electronic effects in the length distribution of atom chains

被引：43

作者：

Crain, JN ^{[1
]}

Stiles, MD ^{[1
]}

Stroscio, JA ^{[1
]}

Pierce, DT ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Electron Phys Grp, Gaithersburg, MD 20899 USA

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 96卷 / 15期

关键词：

D O I：

10.1103/PhysRevLett.96.156801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Gold deposited on Si(553) leads to self-assembly of atomic chains, which are broken into finite segments by defects. Scanning tunneling microscopy is used to investigate the distribution of chain lengths and the correlation between defects separating the chains. The length distribution reveals oscillations that indicate changes in the cohesive energy as a function of chain length. We present a possible interpretation in terms of the electronic scattering vectors at the Fermi surface of the surface states. The pairwise correlation function between defects shows long-range correlations that extend beyond nearest-neighbor defects, indicating coupling between chains.

引用

页码：1 / 4

页数：4