Hot electron injection into aqueous electrolyte solution from thin insulating film-coated electrodes

被引:42
作者
Kulmala, S [1 ]
Ala-Kleme, T
Joela, H
Kulmala, A
机构
[1] Univ Turku, Dept Chem, FIN-20014 Turku, Finland
[2] Univ Jyvaskyla, Dept Chem, FIN-40351 Jyvaskyla, Finland
关键词
D O I
10.1007/BF02383720
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Hot electron injection into aqueous electrolyte solution was studied with electrochemiluminescence and electron paramagnetic resonance (EPR) methods. Both methods provide further indirect support for the previously proposed hot electron emission mechanisms from thin insulating film-coated electrodes to aqueous electrolyte solutions. The results do not rule out the possibility of hydrated electron being as a cathodic intermediate in the reduction reactions at cathodically pulse-polarized thin insulating film-coated electrodes. However, no direct evidence for electrochemical generation of hydrated electrons could be obtained with EPR, only spin-trapping experiments could give information about the primary cathodic steps.
引用
收藏
页码:91 / 95
页数:5
相关论文
共 27 条
[1]   Generation of free radicals and electrochemiluminescence at pulse-polarized oxide-covered silicon electrodes in aqueous solutions [J].
AlaKleme, T ;
Kulmala, S ;
Latva, M .
ACTA CHEMICA SCANDINAVICA, 1997, 51 (05) :541-546
[2]   THEORY OF HIGH-FIELD ELECTRON-TRANSPORT AND IMPACT IONIZATION IN SILICON DIOXIDE [J].
ARNOLD, D ;
CARTIER, E ;
DIMARIA, DJ .
PHYSICAL REVIEW B, 1994, 49 (15) :10278-10297
[3]   PHOTO-IONIZATION OF SOLUTES AND CONDUCTION-BAND EDGE OF SOLVENTS - INDOLE IN WATER AND ALCOHOLS [J].
BERNAS, A ;
GRAND, D ;
AMOUYAL, E .
JOURNAL OF PHYSICAL CHEMISTRY, 1980, 84 (10) :1259-1262
[4]  
BIRKS J, 1970, PHOTOPHYSICS AROMATI, P3971
[5]   CRITICAL-REVIEW OF RATE CONSTANTS FOR REACTIONS OF HYDRATED ELECTRONS, HYDROGEN-ATOMS AND HYDROXYL RADICALS (.OH/.O-) IN AQUEOUS-SOLUTION [J].
BUXTON, GV ;
GREENSTOCK, CL ;
HELMAN, WP ;
ROSS, AB .
JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA, 1988, 17 (02) :513-886
[6]   MECHANISM FOR STRESS-INDUCED LEAKAGE CURRENTS IN THIN SILICON DIOXIDE FILMS [J].
DIMARIA, DJ ;
CARTIER, E .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (06) :3883-3894
[7]   VACUUM EMISSION OF HOT-ELECTRONS FROM SILICON DIOXIDE AT LOW-TEMPERATURES [J].
DIMARIA, DJ ;
FISCHETTI, MV .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (09) :4683-4691
[8]   PULSE-RADIOLYSIS STUDY OF AQUEOUS BENZENE SOLUTIONS [J].
GORDON, S ;
SCHMIDT, KH ;
HART, EJ .
JOURNAL OF PHYSICAL CHEMISTRY, 1977, 81 (02) :104-109
[9]   SPECIFIC DETERMINATION OF TRACE COPPER(II) BY CATHODIC ELECTROLUMINESCENCE [J].
HAAPAKKA, K ;
KANKARE, J ;
KULMALA, S .
ANALYTICA CHIMICA ACTA, 1988, 211 (1-2) :105-118
[10]   FLUOROPHOR-ENHANCED CATHODIC ELECTROLUMINESCENCE AT AN OXIDE-COVERED ALUMINUM ELECTRODE [J].
HAAPAKKA, K ;
KANKARE, J ;
PUHAKKA, O .
ANALYTICA CHIMICA ACTA, 1988, 207 (1-2) :195-210