Performance of a cryogenic silicon monochromator under extreme heat load

被引:36
作者
Chumakov, A
Rüffer, R
Leupold, O
Celse, JP
Martel, K
Rossat, M
Lee, WK
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[3] Kurchatov Inst, Russian Res Ctr, Moscow 123182, Russia
关键词
X-ray optics; cryogenic cooling; high-heat-load optics; silicon monochromators;
D O I
10.1107/S0909049503026785
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The performance of an indirectly cooled cryogenic silicon monochromator under heat loads up to 870 W has been studied. The investigation was performed over numerous parameters and included measurements of total flux, spectral density, rocking curves, angular beam profiles and crystal slope errors. An almost ideal monochromator performance was observed in the 270 - 570 W range of the heating power. At a heat load of similar to 400 W and under standard operation conditions, the crystal distortions did not exceed 1 murad. At the highest available heat load of 870 W, the crystal distortions were about 7 murad.
引用
收藏
页码:132 / 141
页数:10
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