Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

被引：29

作者：

Biddulph, Gregory X. ^{[1
]}

Piwowar, Alan M. ^{[1
]}

Fletcher, John S. ^{[1
]}

Lockyer, Nicholas P. ^{[1
]}

Vickerman, John C. ^{[1
]}

机构：

[1] Univ Manchester, Manchester Interdisciplinary Bioctr, Manchester M1 7DN, Lancs, England

来源：

ANALYTICAL CHEMISTRY | 2007年 / 79卷 / 19期

关键词：

D O I：

10.1021/ac071442x

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

C-84(+) and coronene (C24H12+) have been studied as primary ions for use in secondary ion mass spectrometry. A representative range of samples has been used to compare the effectiveness of each primary ion with the existing C-60(+), Au+, and Au3+ primary ions. It was found that C-84 is the most effective primary ion providing higher secondary ion yields and a high molecular to fragment ion ratio. Coronene had a performance similar to C-60. Coronene and C-60 primary ions were also used to extend a previous study of matrix suppression/enhancement effects. The C-60 was found to ameliorate this effect, possibly due to the increase in protonation in polyatomic sputtering, and coronene was found to further reduce suppression showing evidence of a chemical effect.

引用

页码：7259 / 7266

页数：8

共 33 条

[21] VAPOR-PRESSURE OF C-60 BUCKMINSTERFULLERENE [J].

PIACENTE, V ;

GIGLI, G ;

SCARDALA, P ;

GIUSTINI, A ;

FERRO, D .

JOURNAL OF PHYSICAL CHEMISTRY, 1995, 99 (38) :14052-14057

[22]

PIACENTE V, 1997, J PHYS CHEM A, V24, P101

[23] Microscopic insights into the sputtering of Ag{111} induced by C60 and Ga bombardment [J].

Postawa, Z ;

Czerwinski, B ;

Szewczyk, M ;

Smiley, EJ ;

Winograd, N ;

Garrison, BJ .

JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (23) :7831-7838

[24]

Russo N, 1998, J COMPUT CHEM, V19, P989, DOI 10.1002/(SICI)1096-987X(19980715)19:9<989::AID-JCC1>3.0.CO

[25]

2-F

[26]

SIGMUND P, 1981, SPUTTERING PARTICLE, V1, P9

[27] Effect of cluster size in kiloelectronvolt cluster bombardment of solid benzene [J].

Smiley, Edward J. ;

Winograd, Nicholas ;

Garrison, Barbara J. .

ANALYTICAL CHEMISTRY, 2007, 79 (02) :494-499

[28]

VICKERMAN JC, 2001, TOF SIMS SURFACE ANA

[29] A C60 primary ion beam system for time of flight secondary ion mass spectrometry:: Its development and secondary ion yield characteristics [J].

Weibel, D ;

Wong, S ;

Lockyer, N ;

Blenkinsopp, P ;

Hill, R ;

Vickerman, JC .

ANALYTICAL CHEMISTRY, 2003, 75 (07) :1754-1764

[30] Matrix-enhanced secondary ion mass spectrometry: A method for molecular analysis of solid surfaces [J].

Wu, KJ ;

Odom, RW .

ANALYTICAL CHEMISTRY, 1996, 68 (05) :873-882

← 1 2 3 4 →