Hydrogen trapping in oxygen-deficient hafnium silicates

被引:7
作者
Fonseca, L. R. C.
Xavier, A. L., Jr.
Ribeiro, M., Jr.
Driemeier, C.
Baumvol, I. J. R.
机构
[1] Wernher Braun Ctr Adv Res, BR-13098381 Campinas, SP, Brazil
[2] Univ Fed Rio Grande do Sul, Inst Fis, BR-91501970 Porto Alegre, RS, Brazil
[3] Univ Caxias Sul, CCET, BR-95070560 Caxias Do Sul, RS, Brazil
[4] Univ Fed Rio Grande do Sul, BR-91501970 Porto Alegre, RS, Brazil
关键词
D O I
10.1063/1.2769790
中图分类号
O59 [应用物理学];
学科分类号
摘要
Isotopic substitution, nuclear reaction analysis, and x-ray photoelectron spectroscopy were employed to show that oxygen-deficient hafnium (Hf) silicates trap hydrogen atoms. Based on this experimental observation, we used first-principles calculations to investigate the structure, energetics, and electronic properties of H interacting with O vacancies in a hafnium silicate model. We found that O vacancies close to a Si atom are energetically favored when compared to vacancies in HfO2-like regions, implying that close-to-Si O vacancies are more likely to occur. Trapping of two H atoms at a close-to-Si O vacancy passivates the vacancy-induced gap states. The first H interacts with neighboring Hf atoms, whereas the second H binds to the Si atom. (c) 2007 American Institute of Physics.
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页数:6
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