Ion source design criteria for AMS

被引：8

作者：

Kilius, LR ^{[1
]}

Kieser, WE ^{[1
]}

Litherland, AE ^{[1
]}

Zhao, XL ^{[1
]}

Rucklidge, JC ^{[1
]}

Beukens, RP ^{[1
]}

机构：

[1] UNIV TORONTO,ISOTRACE LAB,TORONTO,ON M5S 1A7,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1997年 / 123卷 / 1-4期

关键词：

D O I：

10.1016/S0168-583X(96)00715-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The requirements for AMS solid sample ion sources: high stable currents, high efficiency, low memory effect, rapid sample switching and isobar separation are reviewed and the application of a variety of sources, using negative and neutral primary sputtering beams and thermal ionization, in addition to the traditionally used Csf sputter source, is described. Discussion follows on the use of charge changing as a logical extension of the ion production and specification process. Examples are taken from work currently in progress at IsoTrace, particularly that begun by L.R. Kilius on resonant charge changing and on the analysis of non-conducting sample materials.

引用

收藏

页码：5 / 9

页数：5

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