Reliability analysis for Power Electronics Modules

被引:10
作者
Bailey, C. [1 ]
Tilford, T. [1 ]
Lu, H. [1 ]
机构
[1] Univ Greenwich, Sch Comp & Math Sci, London SE10 9LS, England
来源
2007 30TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY | 2007年
关键词
D O I
10.1109/ISSE.2007.4432813
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses the reliability of Power Electronics Modules. The approach taken combines numerical modeling techniques with experimentation and accelerated testing to identify failure modes and mechanisms for the power module structure and most importantly the root cause of a potential failure. The paper details results for two types of failure (i) wire bond fatigue and (ii) substrate delamination. Finite Element Method modeling techniques have been used to predict the stress distribution within the module structures. A response surface optimisation approach has been employed to enable the optimal design and parameter sensitivity to be determined The response surface is used by a Monte Carlo method to determine the effects of uncertainty in the design.
引用
收藏
页码:12 / 17
页数:6
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