Fabrication of carbon-based field emitters using stamp technology

被引:15
作者
Baba, A [1 ]
Hizukuri, M [1 ]
Iwamoto, M [1 ]
Asano, T [1 ]
机构
[1] Kyushu Inst Technol, Ctr Microelect Syst, Iizuka, Fukuoka 8208502, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 12B期
关键词
stamp technology; field emission; field emitter; carbon-based material; ion-beam modification;
D O I
10.1143/JJAP.38.7203
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose and demonstrate stamp technology, a novel processing technique for a field electron emitter, in which emitter tips are fabricated by pressing a mold into a spin-coated organic material to completely transform the shape of the mold. The material is then modified by ion irradiation to produce a carbon-based emitter material. Starting materials tested were a high-temperature-cured polyimide and a photoresist (novolac resin). The shape of the mold can be completely transferred to these materials at pressure over 700 MPa at 250 degreesC. A held-emission current up to the order of muA is obtained from emitters fabricated by this new technology with modification using Ar-ion irradiation at an energy of 100keV to a dose of 3 x 10(16) cm(-2). The ion-beam-irradiation effect on polyimide and photoresist materials is also investigated in terms of electrical conductivity and chemical bonds.
引用
收藏
页码:7203 / 7207
页数:5
相关论文
共 10 条
[1]   SIMULATION OF GEOMETRICAL CHANGE EFFECTS ON ELECTRICAL CHARACTERISTICS OF MICROMETER-SIZE VACUUM TRIODE WITH FIELD EMITTERS [J].
ASANO, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (10) :2392-2394
[2]   FIELD-EMISSION FROM ION-MILLED DIAMOND FILMS ON SI [J].
ASANO, T ;
OOBUCHI, Y ;
KATSUMATA, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (02) :431-434
[3]   Field emission from an ion irradiated photoresist [J].
Asano, T ;
Shibata, E ;
Sasaguri, D ;
Makihira, K ;
Higa, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1997, 36 (6B) :L818-L820
[4]   Ion beam modification of a photoresist and its application to field emitters [J].
Asano, T ;
Sasaguri, D ;
Shibata, E ;
Higa, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (12B) :7749-7753
[5]   Field emission from an ion-beam-modified polyimide film [J].
Baba, A ;
Higa, K ;
Asano, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (3A) :L261-L263
[6]  
Betsui K., 1991, 4 INT VAC MICR C NAG, P26
[7]   Enhancement of electron emission efficiency of Mo tips by diamondlike carbon coatings [J].
Chuang, FY ;
Sun, CY ;
Cheng, HF ;
Huang, CM ;
Lin, IN .
APPLIED PHYSICS LETTERS, 1996, 68 (12) :1666-1668
[8]   PATTERNING OF CVD DIAMOND FILMS BY SEEDING AND THEIR FIELD-EMISSION PROPERTIES [J].
KATSUMATA, S ;
OOBUCHI, Y ;
ASANO, T .
DIAMOND AND RELATED MATERIALS, 1994, 3 (11-12) :1296-1300
[9]  
NAKAMOTO M, 1994, P 7 INT VAC MICR C G, P41
[10]   COLD FIELD-EMISSION FROM CVD DIAMOND FILMS OBSERVED IN EMISSION ELECTRON-MICROSCOPY [J].
WANG, C ;
GARCIA, A ;
INGRAM, DC ;
LAKE, M ;
KORDESCH, ME .
ELECTRONICS LETTERS, 1991, 27 (16) :1459-1461