Unusual Ti adsorption on Si(001) and subsequent activation of Si ejection

被引:25
作者
Yu, BD
Miyamoto, Y
Sugino, O
Sasaki, T
Ohno, T
机构
[1] NEC Corp Ltd, Fundamental Res Labs, Tsukuba, Ibaraki 305, Japan
[2] Natl Res Inst Met, Tsukuba, Ibaraki 305, Japan
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 07期
关键词
D O I
10.1103/PhysRevB.58.3549
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The epitaxy of Ti on Si(001) exhibits a profound intermixing of Ti and Si atoms giving rise to the formation of titanium silicide. This phenomenon differs considerably from typical epitaxial growth and is not understood. Using first-principles total-energy calculations we examined the reaction of a Ti adatom with a Si(001) surface. We found that the penetration of the Ti adatom into a near-surface interstitial site and the subsequent ejection of its neighboring surface Si atoms onto a terrace is kinematically favored with respect to the "normal" hopping diffusion on a Si surface. These reactive processes provide the microscopic mechanism of an initial stage of transition-metal silicidation.
引用
收藏
页码:3549 / 3552
页数:4
相关论文
共 17 条
[1]   Density-functional theory calculations for poly-atomic systems: electronic structure, static and elastic properties and ab initio molecular dynamics [J].
Bockstedte, M ;
Kley, A ;
Neugebauer, J ;
Scheffler, M .
COMPUTER PHYSICS COMMUNICATIONS, 1997, 107 (1-3) :187-222
[2]   BINDING AND DIFFUSION OF A SI ADATOM ON THE SI(100) SURFACE [J].
BROCKS, G ;
KELLY, PJ ;
CAR, R .
PHYSICAL REVIEW LETTERS, 1991, 66 (13) :1729-1732
[3]   GROUND-STATE OF THE ELECTRON-GAS BY A STOCHASTIC METHOD [J].
CEPERLEY, DM ;
ALDER, BJ .
PHYSICAL REVIEW LETTERS, 1980, 45 (07) :566-569
[4]   Plane-wave-basis pseudopotential calculations of the surface relaxations of Ti(0001) and Zr(0001) [J].
Cho, JH ;
Terakura, K .
PHYSICAL REVIEW B, 1997, 56 (15) :9282-9285
[5]   Relaxation of hcp(0001) surfaces: A chemical view [J].
Feibelman, PJ .
PHYSICAL REVIEW B, 1996, 53 (20) :13740-13746
[6]  
FUCHS M, UNPUB
[7]   ANALYSIS OF SEPARABLE POTENTIALS [J].
GONZE, X ;
STUMPF, R ;
SCHEFFLER, M .
PHYSICAL REVIEW B, 1991, 44 (16) :8503-8513
[8]   Polarity effect of electromigration in Ni2Si contacts on Si [J].
Huang, JS ;
Liou, HK ;
Tu, KN .
PHYSICAL REVIEW LETTERS, 1996, 76 (13) :2346-2349
[9]   REACTIVE ADSORPTION AND DIFFUSION OF TI ON SI(001) BY SCANNING-TUNNELING-MICROSCOPY [J].
ISHIYAMA, K ;
TAGA, Y ;
ICHIMIYA, A .
PHYSICAL REVIEW B, 1995, 51 (04) :2380-2386
[10]  
Kittel C., 1986, INTRO SOLID STATE PH