Superior radiation tolerance of thin epitaxial silicon detectors

被引:44
作者
Kramberger, G
Contarato, D
Fretwurst, E
Hönniger, F
Lindström, G
Pintilie, I
Röder, R
Schramm, A
Stahl, J
机构
[1] DESY, D-22607 Hamburg, Germany
[2] Univ Hamburg, Inst Phys Expt, D-22761 Hamburg, Germany
[3] CiS Inst Mikrosensorik gGmbH, D-99099 Erfurt, Germany
[4] Natl Inst Mat Phys, R-76900 Bucharest, Romania
关键词
silicon detectors; charge collection efficiency; LHC upgrade;
D O I
10.1016/j.nima.2003.07.021
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
For the LHC upgrade (fluences up to 10(16) p/cm(2)) epi-Si devices are shown to be a viable solution. No type inversion was measured up to 1.3 x 10(15) 24 GeV/c protons/cm(2) and the charge collection efficiency (CCE) remained close to 100%. For reactor neutrons CCE was measured to be 60% at 8 x 10(15) n/cm(2). Annealing measurements have shown that only moderate cooling during beam off periods would be necessary. As a tentative explanation for the superior quality of these devices, we assume that radiation-induced donor generation leads to compensation effects of deep acceptors. In the future, we will extend the experiments to fluences up to 10(16) p/cm(2) and use also different variants of the epi-Si material and device geometry. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:665 / 670
页数:6
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