Chalcogenide glasses based on germanium disulfide for second harmonic generation

被引:53
作者
Guignard, Marie
Nazabal, Virginie [1 ]
Smektala, Frederic
Adam, Jean-Luc
Bohnke, Odile
Duverger, Claire
Moreac, Alain
Zeghlache, Hassina
Kudlinski, Alexandre
Martinelli, Gilbert
Quiquempois, Yves
机构
[1] Univ Rennes 1, CNRS 6226, UMR, F-35042 Rennes, France
[2] Univ Bourgogne, CNRS 5209, Inst Cornot Bourgogne, Dept OMR,UMR, F-21078 Dijon, France
[3] Univ Rennes 1, CNRS 6626, GMCM, UMR, F-35042 Rennes, France
[4] Univ Sci Technol Lille, CNRS 8523, Lab PhLAM, UMR, F-59655 Villeneuve Dascq, France
关键词
D O I
10.1002/adfm.200700047
中图分类号
O6 [化学];
学科分类号
0703 [化学];
摘要
High second-order susceptibilities are created by thermal poling in bulk germanium disulfide based chalcogenide glasses. Experimental conditions of the poling treatment (temperature, voltage, time) were optimized for each glass composition. The second-order nonlinear signals were recorded by using the Maker fringes experiment and a second-order coefficient chi((2)) up to 8 pm V-1 was measured in the Ge25Sb10S65 glass. This value is obtained using a simulation based on accurate knowledge of the thickness of the nonlinear layer. Two mechanisms are proposed to explain the creation of a nonlinear layer under the anode: the formation and the migration of charged defects towards the anode may mainly occur in Ge20Ga5Sb10S65 and Ge25Ga5S70 glasses, whereas the migration of Na+ ions towards the cathode may be responsible for the accumulation of negative charges under the anode in Ge33S67 and Ge25Sb10S65 glasses. Different electronic conductivity behaviors seem to be at the origin of the phenomenon. In parallel, the potential effect of the poling treatment on the structural and electronic properties is studied using Raman spectroscopy and secondary ion mass spectroscopy measurements.
引用
收藏
页码:3284 / 3294
页数:11
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