Epitaxial thin film heterostructures of relaxor ferroelectric Pb(Mg1/3Nb2/3)O3-PbTiO3

被引：19

作者：

Lavric, D ^{[1
]}

Rao, RA

Gan, Q

Krajewski, JJ

Eom, CB

机构：

[1] Duke Univ, Dept Mech Engn & Mat Sci, Durham, NC 27708 USA

[2] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA

来源：

INTEGRATED FERROELECTRICS | 1998年 / 21卷 / 1-4期

基金：

美国国家科学基金会;

关键词：

relaxor ferroelectric; lead magnesium niobate lead titanate; pulsed laser deposition; ferroelectric thin film heterostructures;

D O I：

10.1080/10584589808202090

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have grown stoichiometric pure perovskite phase Pb(Mg1/3Nb2/3)O-3- PbTiO3 (PMN-PT) thin films and PMN-PT/SrRuO3 heterostructures on miscut (100) SrTiO3 substrates by pulsed laser deposition. X-ray diffraction theta-2 theta scans show that the PMN-PT films are purely c-axis oriented. The off-axis phi scans show that the heterostructures grow "cube-on-cube" with an in-plane epitaxial arrangement of PMN-PT[100],[010] // SrRuO3[001] // SrTiO3[100] and PMN-PT[010],[100] // SrRuO3[(1) over bar 10] // SrTiO3[010]. The crystalline quality of the films found to be comparable to that of bulk single crystals. The AFM images show that the SrRuO3 and PMN-PT layers have smooth surfaces with root mean square roughness of 9 Angstrom. These epitaxial heterostructures can be used for the fabrication of piezoelectric devices.

引用

页码：499 / 509

页数：11

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