SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

被引：9

作者：

Koga, R ^{[1
]}

Crain, SH ^{[1
]}

Yu, P ^{[1
]}

Crawford, KB ^{[1
]}

机构：

[1] Aerospace Corp, Los Angeles, CA 90009 USA

来源：

2000 IEEE RADIATION EFFECTS DATA WORKSHOP - WORKSHOP RECORD | 2000年

关键词：

D O I：

10.1109/REDW.2000.896268

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have devised ways to measure the SEE sensitivity of plastic-encapsulated, high-density DRAMs with the use of limited-range heavy ions. The sensitivity at low LET regions is verified using a few species of ions with a long range.

引用

页码：45 / 52

页数：8