An empirical model for predicting proton induced upset

被引：86

作者：

Calvel, P

Barillot, C

Lamothe, P

Ecoffet, R

Duzellier, S

Falguere, D

机构：

[1] CTR NATL ETUD SPATIALES,F-31055 TOULOUSE,FRANCE

[2] CERT,ONERA,DEPT ETUD & RECH TECHNOL SPATIALE,F-31055 TOULOUSE,FRANCE

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1996年 / 43卷 / 06期

关键词：

D O I：

10.1109/23.556873

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents an empirical model for proton induced Single Event Upset (SEU). This model is based on heavy ion data, and will improve the previous 'two parameters' Bendel model. Application to various parts is presented.

引用

页码：2827 / 2832

页数：6

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