Effects of rapidly decaying plasmas on Langmuir probe measurements

被引:15
作者
Ding, GW [1 ]
Scharer, JE [1 ]
Kelly, KL [1 ]
机构
[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
关键词
D O I
10.1063/1.368189
中图分类号
O59 [应用物理学];
学科分类号
摘要
Sheath motion, displacement current, and probe edge effects on temporal Langmuir probe (LP) ion saturation current measurements are investigated for a pulsed laser produced plasma during the period 100 ns-->1000 ns after the turn on of the laser pulse. The plasma has a large volume (hundreds of cm(3)) and a high initial plasma density (n(e)>10(13) cm(-3)). The sheath motion and edge effects are found to be very important, but the displacement current is found to be very small. We present both a quantitative correction for the effects of rapidly decaying plasmas on LP ion saturation current measurements and a validity condition for this method. The results are compared with the densities predicted from electron saturation currents, and the former are less than or equal to 30% lower than the latter. The corrected probe measurements are utilized to determine the plasma recombination coefficient. It is found to be in good a,agreement with the results obtained by Stalder and Eckstrom [J. Appl. Phys. 72, 3917 (1992)] who utilized a microwave method. (C) 1998 American Institute of Physics.
引用
收藏
页码:1236 / 1240
页数:5
相关论文
共 14 条
[11]   Properties of a vacuum ultraviolet laser created plasma sheet for a microwave reflector [J].
Shen, W ;
Scharer, JE ;
Lam, NT ;
Porter, BG ;
Kelly, KL .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (12) :6974-6979
[12]   AFTERGLOW DECAY KINETICS OF NONUNIFORM PLASMAS WITH CYLINDRICAL SYMMETRY - APPLICATION TO THE MEASUREMENT OF ELECTRON DECAY IN LARGE, PHOTOIONIZED PLASMAS IN ATMOSPHERIC-PRESSURE HELIUM [J].
STALDER, KR ;
ECKSTROM, DJ .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (09) :3917-3923
[13]  
TUKOT RB, 1993, J APPL PHYS, V73, P2173
[14]   PLASMA GENERATION IN AN ORGANIC MOLECULAR GAS BY AN ULTRAVIOLET-LASER PULSE [J].
ZHANG, YS ;
SCHARER, JE .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (10) :4779-4784