Evidence for a second contact value formula for the electric double layer

被引：12

作者：

Henderson, D. ^{[1
]}

Bhuiyan, L. B.

机构：

[1] Brigham Young Univ, Dept Chem & Biochem, Provo, UT 84602 USA

[2] Univ Puerto Rico, Dept Phys, Phys Theor Lab, San Juan, PR 00931 USA

来源：

MOLECULAR SIMULATION | 2007年 / 33卷 / 11期

关键词：

electric double layer; contact value formula; charge profile; primitive model; Monte Carlo simulation;

D O I：

10.1080/08927020701461247

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The results of some recent Monte Carlo simulations (Bhuiyan et al. J. Electroanal. Chem., in press) for the electric double layer formed by rigid ions of equal diameter (the solute) in a continuum dielectric (the solvent), next to a uniformly charged planar hard wall are examined. A contact value formula for the sum of the density profiles of this system has long been known (Henderson et al. J. Electroanal. Chem. 102, 315 (1979)). Here we propose a simple formula for the contact value of the charge profile in the limit of low electrode charge density. The evidence obtained from the aforementioned simulations supports this formula.

引用

页码：953 / 957

页数：5

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