Deformation and fracture of Ti-Si-N nanocomposite films

被引:33
作者
Cairney, JM [1 ]
Hoffman, MJ
Munroe, PR
Martin, PJ
Bendavid, A
机构
[1] Univ New S Wales, Sydney, NSW 2052, Australia
[2] CSIRO Telecommun & Ind Phys, Sydney, NSW 2070, Australia
关键词
transmission electron microscopy (TEM); focused ion beam (FIB); nanostructures; titanium nitride (TiN);
D O I
10.1016/j.tsf.2004.11.185
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The deformation and fracture of Ti-Si-x-N coatings of varying Si content were examined by cross-sectional transmission microscopy. Cross-sections were prepared through both undeformed coatings and coatings which had previously been indented using a 5 mu m radius spherically tipped diamond indenter. Samples with low silicon contents (0.8 and 1.5 at.%Si) had a columnar grain structure which deformed by inter-ranular cracking and shear sliding at the grain boundaries. Samples with higher silicon contents (9.5 and 12.5 at.%Si) consisted of TiN nanocrystals similar to 5 nm in size connected by an amorphous Si3N4 phase. These coatings contained a limited amount of intergranular cracking. The nanocrystalline coatings are thought to undergo quasi-plastic deformation behaviour via cracking oil a nanometer scale, where the crack size is of the order of the grain size. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:193 / 200
页数:8
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