Microstructure of novel superhard nanocrystalline amorphous composites as analyzed by high resolution transmission electron microscopy

被引：118

作者：

Christiansen, S

Albrecht, M

Strunk, HP

Veprek, S

机构：

[1] Tech Univ Munich, Inst Chem Inorgan Mat, D-85747 Garching, Germany

[2] Univ Erlangen Nurnberg, Inst Mat Sci, D-91058 Erlangen, Germany

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1998年 / 16卷 / 01期

关键词：

D O I：

10.1116/1.589778

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The recently developed, novel superhard nanocrystalline composites nc-TiN/a-Si3N4 have been investigated by means of high resolution transmission electron microscopy. The microstructure consisting of nanocrystalline TiN imbedded within a less than or equal to 1 nm thin amorphous Si3N4, the relative amount of both phases, and the TiN-crystallite size which were previously determined by means of x-ray diffraction and energy dispersive analysis of x rays have been directly confirmed. (C) 1998 American Vacuum Society.

引用

页码：19 / 22

页数：4

共 22 条

[1] Semiconductor clusters, nanocrystals, and quantum dots
Alivisatos, AP
[J]. SCIENCE, 1996, 271 (5251) : 933 - 937
[2] [Anonymous], PLASMA CHEM PLASMA P
[3] BARNETT SA, 1993, PHYSICS THIN FILMS M, V17
[4] BUCKSCHLOSS M, UNPUB
[5] A SIMPLE, MIXTURES-BASED MODEL FOR THE GRAIN-SIZE DEPENDENCE OF STRENGTH IN NANOPHASE METALS
CARSLEY, JE
NING, J
MILLIGAN, WW
HACKNEY, SA
AIFANTIS, EC
[J]. NANOSTRUCTURED MATERIALS, 1995, 5 (04): : 441 - 448
[7] KELLY A, 1986, STORNG SOLIDS
[8] Klug H.P., 1974, XRAY DIFFRACTION PRO, V2nd, P992
[9] ATTEMPT TO DESIGN A STRONG SOLID
KOEHLER, JS
[J]. PHYSICAL REVIEW B, 1970, 2 (02): : 547 - &
[10] REIPRICH S, 1995, THESIS TU MUNICH

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