X-ray characterisation of Zn1-xCoxS single crystals grown by chemical vapour transport

被引：3

作者：

Paszkowicz, W ^{[1
]}

Domagala, J ^{[1
]}

Golacki, Z ^{[1
]}

机构：

[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 1998年 / 274卷 / 1-2期

关键词：

II-VI semiconductors; (Zn; Co)S; CoS; lattice parameter; interatomic distances;

D O I：

10.1016/S0925-8388(98)00521-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Single Zn1-xCoxS crystals with x up to about 0.285 were grown by the chemical vapour transport method using iodine as the transporting agent. The obtained single crystal grains were typically of up to 3-6 mm in size. The crystal quality was studied with the help of high-resolution diffractometry. The FWHM of rocking curves was of the order of 40". Lattice constants measured by both, the powder diffractometry and high-resolution diffractometry, are reported and compared with the literature data. The extrapolated lattice constant for hypothetical CoS compound of sphalerite-type structure is 5.343(1) Angstrom. The interatomic distances in Zn1-xCoxS and in related Fe and Mn containing sulphides are briefly discussed. (C) 1998 Elsevier Science S.A.

引用

页码：128 / 135

页数：8

共 56 条

[1] X-RAY AND ELECTRON-OPTICAL CHARACTERIZATION OF ZNSE(CO) CRYSTAL WITH NATURAL FACE [J].