X-ray characterisation of Zn1-xCoxS single crystals grown by chemical vapour transport

被引:3
作者
Paszkowicz, W [1 ]
Domagala, J [1 ]
Golacki, Z [1 ]
机构
[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
关键词
II-VI semiconductors; (Zn; Co)S; CoS; lattice parameter; interatomic distances;
D O I
10.1016/S0925-8388(98)00521-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Single Zn1-xCoxS crystals with x up to about 0.285 were grown by the chemical vapour transport method using iodine as the transporting agent. The obtained single crystal grains were typically of up to 3-6 mm in size. The crystal quality was studied with the help of high-resolution diffractometry. The FWHM of rocking curves was of the order of 40". Lattice constants measured by both, the powder diffractometry and high-resolution diffractometry, are reported and compared with the literature data. The extrapolated lattice constant for hypothetical CoS compound of sphalerite-type structure is 5.343(1) Angstrom. The interatomic distances in Zn1-xCoxS and in related Fe and Mn containing sulphides are briefly discussed. (C) 1998 Elsevier Science S.A.
引用
收藏
页码:128 / 135
页数:8
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