Potential roughness near lithographically fabricated atom chips

被引:44
作者
Krueger, P. [1 ,2 ]
Andersson, L. M. [1 ,3 ]
Wildermuth, S. [1 ]
Hofferberth, S. [1 ,4 ]
Haller, E. [1 ]
Aigner, S. [1 ]
Groth, S. [1 ,5 ]
Bar-Joseph, I. [5 ]
Schmiedmayer, J. [1 ,4 ]
机构
[1] Heidelberg Univ, Inst Phys, D-6900 Heidelberg, Germany
[2] Ecole Natl Super, Lab Katler Brossel, F-75005 Paris, France
[3] KTH, Dept Microelect & Informat Technol, SE-16440 Kista, Sweden
[4] Vienna Univ Technol, Atominst Osterreich Univ, A-1020 Vienna, Austria
[5] Weizmann Inst Sci, Dept Condensed Matter Phys, IL-76100 Rehovot, Israel
来源
PHYSICAL REVIEW A | 2007年 / 76卷 / 06期
基金
奥地利科学基金会;
关键词
D O I
10.1103/PhysRevA.76.063621
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Potential roughness has been reported to severely impair experiments in magnetic microtraps. We show that these obstacles can be overcome as we measure disorder potentials that are reduced by two orders of magnitude near lithographically patterned high-quality gold layers on semiconductor atom chip substrates. The spectrum of the remaining field variations exhibits a favorable scaling. A detailed analysis of the magnetic field roughness of a 100-mu m-wide wire shows that these potentials stem from minute variations of the current flow caused by local properties of the wire rather than merely from rough edges. A technique for further reduction of potential roughness by several orders of magnitude based on time-orbiting magnetic fields is outlined.
引用
收藏
页数:8
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