Nanoindentation of glass with a tip-truncated Berkovich indenter

被引：25

作者：

Shimamoto, A

Tanaka, K

Akiyama, Y

Yoshizaki, H

机构：

[1] Department of Mechanical Engineering, Nagaoka University of Technology, Nagaoka, 940-21, Kamitomioka

[2] Nippon Seiki Corporation, Nagaoka

[3] Hitachi Tools Corporation, Narita

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1996年 / 74卷 / 05期

关键词：

D O I：

10.1080/01418619608239710

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The nanoindentation behaviour of a substrate glass to a depth of only 5 nm is examined by using a nanoindentation instrument with a load resolution of 0.1 mu N and a displacement resolution of 0.08 nm(rms). The instrument is capable of detecting contact of the indenter tip with the sample surface with the accuracy of +/- 0.2 nm when operated under displacement controlled conditions. The experimental results are analysed using a three-dimensional finite-element method on a truncated Berkovich pyramidal indentation.

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页码：1097 / 1105

页数：9

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