An empirical correlation for E(J, T) of a melt-cast-processed BSCCO-2212 superconductor under self field

被引：17

作者：

Cha, YS ^{[1
]}

机构：

[1] Argonne Natl Lab, Div Energy Technol, Argonne, IL 60439 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2003年 / 13卷 / 02期

关键词：

fault current limiters; flux-creep resistivity; magnetic diffusion; magnetic relaxation;

D O I：

10.1109/TASC.2003.812976

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An empirical correlation is developed for the electrical field strength E(J, T) of a melt-cast processed BSCCO2212 superconductor. The empirical correlation is based, in part, on the theory of magnetic relaxation and on experimental data at 77 and 87 K. It is developed for temperatures in the range between 77 and 92 K, which is the range of interest for practical devices-such as the superconducting fault-current limiters. The general form of the correlation may be applicable to other high-T-c superconductors.

引用

页码：2028 / 2031

页数：4