Thin polymer films on rough surfaces

被引:27
作者
Tolan, M
Vacca, G
Wang, J
Sinha, SK
Li, Z
Rafailovich, MH
Sokolov, J
Gibaud, A
Lorenz, H
Kotthaus, JP
机构
[1] EXXON RES & ENGN CO,ANNANDALE,NJ 08801
[2] SUNY STONY BROOK,DEPT MAT SCI,STONY BROOK,NY 11794
[3] UNIV MAINE,FAC SCI,F-72017 LE MANS,FRANCE
[4] UNIV MUNICH,SEKT PHYS,D-80539 MUNICH,GERMANY
来源
PHYSICA B | 1996年 / 221卷 / 1-4期
关键词
D O I
10.1016/0921-4526(95)00904-3
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
X-ray diffraction measurements in the region of small incidence and exit angles on thin polystyrene (PS) films deposited on laterally structured surfaces are performed. From fits of the data we obtain how the Fourier-components of the substrates are damped by the adsorbed films. The results are compared with theoretical predictions for liquid films. It turns out that PS-films of low molecular weight (less than or equal to 300k) behave like frozen liquids. Within films of a molecular weight of 1000k viscoelastic forces dominate over the substrate-adsorbate van der Waals-interactions so that even a 680 Angstrom thick film is not totally flat on top of a grating with a height of 130 Angstrom.
引用
收藏
页码:53 / 59
页数:7
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