The creep of lead-free solders at elevated temperatures

被引:61
作者
Plumbridge, WJ [1 ]
Gagg, CR [1 ]
Peters, S [1 ]
机构
[1] Open Univ, Dept Mat Engn, Milton Keynes, Bucks, England
关键词
creep; solders; lead-free; intrinsic resistance;
D O I
10.1007/s11664-001-0147-3
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Full implementation of the new generation of lead-free solders requires a detailed knowledge and understanding of their mechanical behavior, This paper reports an investigation of the creep behavior of three lead-free alloys: Sn-0.5Cu, Sn-3.5Ag, and Sn-3.8Ag-0.7Cu, at 75 degreesC, and compares their response to that of Sn-37Pb at the same temperature. In terms of stress and time to rupture, the Sn-0.5Cu alloy behaves similarly to the eutectic Sn-Pb over the range of rupture lives considered (up to similar to 1000 h). The silver-containing alloys exhibit much greater creep resistance, typically a hundred fold and a thousand fold for the binary and ternary, respectively. These alloys are less ductile but their creep strains to failure are generally above ten percent. Their minimum creep rates are at least 100 times slower. When testing at the same homologous temperature (0.76), the silver-containing alloys retain the substantial superiority. The relationship between applied steady-state (or minimum) creep rate behavior is best described by a power law equation, although the steady state domain generally occupies less than 30 percent of life. The microstructural changes induced by creep are briefly described and used to explain some of the creep characteristics of the alloys.
引用
收藏
页码:1178 / 1183
页数:6
相关论文
共 11 条
[1]  
ARROWOOD R, 1990, SOLDER MECH STATE AR, P1007
[2]  
GAGG CR, IN PRESS
[3]   MICROSTRUCTURE AND MECHANICAL-PROPERTIES OF PB-FREE SOLDER ALLOYS FOR LOW-COST ELECTRONIC ASSEMBLY - A REVIEW [J].
GLAZER, J .
JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (08) :693-700
[4]   Creep phenomena in lead-free solders [J].
Igoshev, VI ;
Kleiman, JI .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (02) :244-250
[5]  
PAU YH, 1993, J ELECT PKG, V115, P1
[6]   Materials behaviour and the reliability in performance of solder joints [J].
Plumbridge, WJ .
SOLDERING & SURFACE MOUNT TECHNOLOGY, 1999, 11 (03) :8-11
[7]   Effects of strain rate and temperature on the stress-strain response of solder alloys [J].
Plumbridge, WJ ;
Gagg, CR .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 1999, 10 (5-6) :461-468
[8]  
PLUMBRIDGE WJ, HIGH TEMPERATURE FAT, P177
[9]  
SOLOMON HD, 1991, SOLDER JOINT RELIABI, P406
[10]  
VINCENT JH, 1994, GEC-J RES, V11, P76