Quantitative analysis of L-edge white line intensities: the influence of saturation and transverse coherence

被引:1
作者
Hahlin, A
Karis, O
Brena, B
Dunn, JH
Arvanitis, D
机构
[1] Univ Uppsala, Dept Phys, Uppsala, Sweden
[2] Stanford Univ, Stanford Linear Accelerator Ctr, Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA
关键词
D O I
10.1107/S0909049500018367
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
[No abstract available]
引用
收藏
页码:437 / 439
页数:3
相关论文
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