ANGULAR DEPENDENT PHOTOELECTRIC YIELD - MEASUREMENT OF THE LA3D AUGER AND AUTOIONIZATION LIFE TIME WIDTHS

被引：36

作者：

VANDERLAAN, G

THOLE, BT

机构：

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1988年 / 46卷 / 02期

关键词：

D O I：

10.1016/0368-2048(88)80010-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：123 / 129

页数：7

共 23 条

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