ILGAR technology IV:: ILGAR thin film technology extended to metal oxides

被引:33
作者
Bär, M [1 ]
Muffler, HJ [1 ]
Fischer, CH [1 ]
Lux-Steiner, MC [1 ]
机构
[1] Hahn Meitner Inst Berlin GmbH, Abt Photochem S 2, Dept Heterogeneous Mat Syst, D-14109 Berlin, Germany
关键词
chemical deposition; thin film; zinc oxide; buffer layer;
D O I
10.1016/S0927-0248(00)00270-1
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
An ion layer gas reaction (ILGAR) technique for the deposition of thin metal oxide films such as zinc oxide has been developed. In a cyclic process a solid precursor layer was applied on a substrate by dipping in a Zn(ClO4)(2) solution and subsequent drying. Reaction with gaseous NH3/H2O led to a hydroxide layer which is thermally dehydrated to ZnO. The steps were repeated until the desired layer thickness was obtained. Under optimized conditions the chlorine remainder lay below 0.3 at%. X-ray-diffraction revealed a preferred orientation concerning the (002) plane. The band gap was determined to E-gap = 3.38 eV. First ZnO/CIGSSe solar cells showed efficiencies of 10.7%. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:113 / 120
页数:8
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