Spatially resolved study of superconducting tunnel junctions x-ray detectors by low temperature scanning synchrotron microscopy

被引：8

作者：

Pressler, H

Ohkubo, M

Koike, M

Zama, T

Fukuda, D

Kobayashi, N

机构：

[1] Electrotech Lab, Quantum Radiat Div, Tsukuba, Ibaraki 3058568, Japan

[2] Univ Tokyo, Tokyo, Japan

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2001年 / 11卷 / 01期

关键词：

superconducting tunnel junctions; X-ray detectors; superconducting devices; image processing;

D O I：

10.1109/77.919440

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A low temperature scanning synchrotron microscope (LTSSM) has been developed for spatial analysis of superconducting tunnel junction X-ray detectors. One and two-dimensional images of the detector response to X-rays were measured by scanning the junctions kept at a working temperature of about 0.4 K with a highly collimated synchrotron radiation beam. The collimation was performed by inserting a pinhole mounted on a scanning unit into the synchrotron radiation in the range of 3-6 keV. The spatial resolution of the LTSSM is between 5 and 10 micrometer. The present results indicate a large discrepancy between the experimental spatial response and a quasiparticle diffusion and edge-toss model. The LTSSM plays an important role in the development of cryogenic X-ray detectors.

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收藏

页码：696 / 699

页数：4

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