Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope

被引:22
作者
Pressler, H [1 ]
Ohkubo, M
Koike, M
Ukibe, M
Zama, T
Nakamura, T
Katagiri, M
机构
[1] Electrotech Lab, Quantum Radiat Div, Tsukuba, Ibaraki 3058568, Japan
[2] Japan Atom Energy Res Inst, Adv Sci Res Ctr, Tokai, Ibaraki 3191195, Japan
关键词
All Open Access; Bronze;
D O I
10.1063/1.1331085
中图分类号
O59 [应用物理学];
学科分类号
摘要
Imaging diagnosis of superconducting tunnel junction x-ray detectors has been performed by an apparatus called the low-temperature scanning synchrotron microscope (LTSSM) using an x-ray microbeam with a diameter of 5-10 mum originated from synchrotron radiation. Quasiparallel intense synchrotron radiation enables one to obtain the full two-dimensional images of junctions with dimensions of 200x200 mum(2) in about 1 h. The LTSSM results indicate that the standard quasiparticle diffusion and edge loss model for the spatial distribution of the junction response to x rays is evidently inadequate for intermediate or large junctions (with respect to a Josephson penetration depth). On this basis, it is argued that the models proposed for the signal creation and loss mechanism should be reconsidered. (C) 2000 American Institute of Physics. [S0003-6951(00)01650-8].
引用
收藏
页码:4055 / 4057
页数:3
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